SEM and FIB applications

SEM and FIB applications

Photonis manufactures detectors optimized for use in Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) systems. In SEM applications, Photonis detectors assist in the output of high resolution imaging through non-destructive testing. And in FIB systems, our detectors are used to amplify the ions and produce a large enough sample to analyze.
Instruments which combine SEM and FIB techniques are ideal for material processing, research and development, and microscopy applications. By enabling low beam energy (200v) analysis for sensitive samples, Photonis detectors provide accurate measurement and edge detection. By combining our expertise in high-resolution imaging with our significant scientific advancements, Photonis is the market leader for SEM and FIB applications. .

Resource center

Are you looking for a specification sheet or paper? Documents like these and more are available in the Photonis Resource Center. 

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